搜索结果: 1-1 共查到“理学 non-contact atomic force microscopy”相关记录1条 . 查询时间(0.078 秒)
Topographic and electronic contrast of the graphene moiré on Ir(111) probed by scanning tunneling microscopy and non-contact atomic force microscopy
Topographi electronic contrast tunneling microscopy non-contact atomic force microscopy
2010/11/23
Epitaxial graphene grown on single crystal transition metal surfaces typically exhibits a moiré
pattern due to the lattice mismatch between graphene and the underlying metal surface. We use si-multan...