搜索结果: 1-10 共查到“分析化学 Electron-”相关记录10条 . 查询时间(0.437 秒)
Probing Excited-State Electron Transfer by Resonance Stark Spectroscopy:4.Mutations near BL in Photosynthetic Reaction Centers Perturb Multiple Factors that Affect BL/fBL+HL
Excited-State Electron Transfer Resonance Stark Spectroscopy Mutations near BL Photosynthetic Reaction Centers Perturb Multiple Factors BL/fBL+HL
2016/5/24
Stark spectra have been obtained in the region of absorption by the accessory bacteriochlorophylls (the B-band region around 800 nm) in Rhodobacter sphaeroides reaction centers. The Stark spectra in t...
Probing Excited-State Electron Transfer by Resonance Stark Spectroscopy:3.Theoretical Foundations and Practical Applications
contracted basis Lanczos algorithm methane vibrational spectroscopy
2016/5/24
Resonance Stark effects are nonclassical Stark effects associated with excited-state charge-transfer processes. The theory of resonance Stark effects developed in Part 2 of this series is generalized ...
Effects of Applied Electric Fields on the Quantum Yields for the Initial Electron Transfer Steps in Bacterial Photosynthesis:II.Dynamic Stark Effect
Applied Electric Fields Quantum Yields Initial Electron Transfer Steps Bacterial Photosynthesis Dynamic Stark Effect
2016/5/23
The quantum yield of the initial charge separation steps in bacterial photosynthetic reaction centers has been shown to be reduced in an applied electric field [Part I, Lao et al., J. Phys. Chem. 97 (...
Remarks on Some Reference Materials for Applications in Elastic Peak Electron Spectroscopy
Remarks Applications Electron Spectroscopy
2010/9/17
The quantification of results of electron spectroscopies, AES and XPS, requires knowledge of the inelastic mean free path (IMFP) of signal electrons in solids. This parameter determines the surface s...
Contribution of Ni KLL Auger Electrons to the Probing Depth of the Conversion Electron Yield Measurements
Contribution of Ni KLL Auger Electrons the Conversion Electron Yield Measurements
2010/9/17
The averaged attenuation length of emitted electrons with the conversion electron yield (CEY) method was evaluated for Ni films with the x-rays below and above the Ni K absorption edge. The evaluated ...
Electron Spectra Line Shape Analysis of Highly Oriented Pyrolytic Graphite and Nanocrystalline Diamond
Electron Spectra Line Shape Analysis Pyrolytic Graphite Nanocrystalline Diamond
2010/9/17
The X-ray excited Auger electron spectroscopy (XAES), X-ray photoelectron spectroscopy (XPS) and elastic peak electron spectroscopy (EPES) methods were applied in investigating samples of nanocrystall...
Effects of Electron Back-scattering in Observations of Cross-sectioned GaAs/AlAs Superlattice with Auger Electron Spectroscopy
Effects Electron Back-scattering Observations Cross-sectioned GaAs/AlAs Superlattice Auger Electron Spectroscopy
2010/9/17
Cross-sections of GaAs/AlAs thin films prepared by cleavage of MBE-grown superlattices have been analyzed with Auger electron spectroscopy with a spatial resolution of 6 nm. Elemental distributions o...
ISO-Compliant Calibration of Energy and Intensity Scales of Electron Spectrometers
ISO-Compliant Calibration Energy Intensity Scales Electron Spectrometers
2010/9/17
The International Organization for Standardization (ISO) decided to establish a Technical Committee 201 (TC201) on the standardization of surface chemical analysis in 1991. Since then, TC201 has publi...
Surface Excitations in Surface Electron Spectroscopies Studied by Reflection Electron Energy-Loss Spectroscopy and Elastic Peak Electron Spectroscopy
Surface Electron Spectroscopies Reflection Electron Energy-Loss Spectroscopy Elastic Peak Electron Spectroscopy
2010/9/17
Surface excitations, in addition to bulk excitation, undergone by signal electrons in surface electron spectroscopies, such as Auger electron spectroscopy, and X-ray photoelectron spectroscopy, play a...
Electron Spectroscopy for Material Characterization
Electron Spectroscopy Material Characterization
2010/6/30
Basic principles of the two electron spectroscopic techniques, the x-ray photoelectron spectroscopy, XPS, and the Auger electron spectroscopy, AES, are given. Their utilization in material characteriz...